Device for noncontact determination of edge profile at a thin disk-shaped object
US9106807B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 4, 2013 |
| Grant date | Aug 11, 2015 |
| Priority date | — |
| Expiry date | Feb 22, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/956
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for noncontact determination of the edge profile at a thin disk-shaped object helps determining the edge profile at semiconductor wafers in which exact image recording is not impaired by specular reflections of the edge profile. A plurality of light sources in the form of laser radiation sources each emitting a line-shaped light bundle are arranged so as to be coplanar in a common plane representing a measurement plane oriented orthogonal to a base plane of the object and are directed from different directions to a common intersection of the laser radiation sources in the edge region of the object. A light sheet is formed in the measurement plane and at least one base camera is directed in the base plane lateral to the measurement plane to capture scattered light proceeding from a light line generated by the light sheet when impinging the object edge region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.