Measurement of surface energy components and wettability of reservoir rock utilizing atomic force microscopy
US9110094B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jan 17, 2014 |
| Grant date | Aug 18, 2015 |
| Priority date | — |
| Expiry date | Jan 22, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q30/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An instrument (and corresponding method) performs AFM techniques to characterize properties of a sample of reservoir rock. The AFM instrument is configured to have a probe with a tip realized from reservoir rock that corresponds to the reservoir rock of the sample. The AFM instrument is operated to derive and store data representing adhesion forces between the tip and the sample at one or more scan locations in the presence of a number of different fluids disposed between the tip and the sample. The AFM instrument is further configured to perform computational operations that process the data representing the adhesion forces for a given scan location in order to characterize at least one property of the rock sample at the given scan location. The properties can include total surface energy of the rock sample as well as wettability of the rock sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.