Measuring device of process automation technology for ascertaining and monitoring a chemical or physical process variable in a high temperature process in a container
US9110165B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 21, 2010 |
| Grant date | Aug 18, 2015 |
| Priority date | — |
| Expiry date | Oct 24, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01Q13/24
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
An apparatus forming a measuring device for ascertaining and monitoring a chemical or physical process variable in a high temperature process in a container, wherein the measuring device is formed from at least a sensor element located in the process and at least a measurement transmitter located outside the process. At least a first sealing element is provided for sealing against penetration of process medium into the sensor element. The sensor element has a boundary location between a first sensor element region, which faces the process and which is embodied with a high thermal resistance, and a second sensor element region, which faces away from the process and which has a low thermal resistance, and that the temperature sensitive element is arranged in the sensor element at the boundary location.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.