Patent · US Active

Method for dummy metal and dummy via insertion

US9111065B2 · kind B2 · utility

2Cited by
11References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 16, 2014
Grant dateAug 18, 2015
Priority date
Expiry dateJan 16, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/39
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of inserting dummy metal and dummy via in an integrated circuit design includes inserting, by a computer, dummy metals using a place and route tool, wherein the place and route tool has timing-awareness to improve a timing performance of the integrated circuit design, and the dummy metals have a length less than or equal to a predetermined maximum length. The method further includes inserting, by the computer, dummy vias using a design-rule-checking utility separately from the inserting of the dummy metals.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.