Cascaded test chain for stuck-at fault verification
US9111848B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 7, 2014 |
| Grant date | Aug 18, 2015 |
| Priority date | — |
| Expiry date | May 7, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318555
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A control circuit generates data signals and configuration commands that are provided to an interface circuit. The interface circuit includes a configuration circuit that generates configuration signals according to the configuration commands and a drive component that generates interface signals according to the data signals. The interface signals are generated with a drive characteristic determined according to the configuration signals applied to configuration devices that selectively activate a configuration of drive devices. A diagnostic circuit is coupled to the control circuit and the interface circuit and is configured to receive a test state indication and acquire a corresponding portion of the configuration signals. The diagnostic circuit compares the test state indication and the portion of the configuration signals to diagnose a stuck-at fault condition within a faulty configuration circuit and propagate a fault indication to the control circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.