Method for temperature stabilization, X-ray detector and CT system

US9113542B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Peter Hackenschmied · Nuremberg, DE
• Christian Schröter · Bamberg, DE

Key dates

• Filing date: Jul 24, 2013
• Grant date: Aug 18, 2015
• Expiry date: Oct 30, 2033

Classification

• Technology area (CPC G): Physics
• CPC primary: G01T1/244
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

A method is disclosed for the temperature stabilization of a direct-converting X-ray detector, including a detector surface having a semiconductor and being divided into a plurality of partial detector surfaces. During the irradiation of the detector surface, heat is generated in the semiconductor by electric power. Electric power generated in the semiconductor is kept constant for each partial detector surface at least during a heterogeneous and/or temporally variable irradiation of the detector surface by feeding-in power-adjusted additional radiation for each partial detector surface. A direct-converting X-ray detector is disclosed for the detection of X-rays. At least one control loop with at least one reference variable is embodied for the energy regulation of the additional radiation, which keeps the temperature in the semiconductor constant for each partial detector surface by keeping the electric power in the semiconductor constant by changing the energy of the additional radiation. A CT system is disclosed.