Optimizing vision correction procedures
US9119561B2 · kind B2 · utility
0Cited by
43References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2014 |
| Grant date | Sep 1, 2015 |
| Priority date | — |
| Expiry date | Aug 28, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/064
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
In one embodiment, a wavefront sensor is combined with a slit lamp eye examination device so that real time aberration values of an eye being examined can be viewed during a slit lamp eye examination session.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.