Methods and apparatus for assessing the quality of a data path including both layer-2 and layer-3 devices
US9124529B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 20, 2012 |
| Grant date | Sep 1, 2015 |
| Priority date | — |
| Expiry date | Sep 5, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04W84/10
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
In some embodiments, an apparatus includes a layer-2 device operably coupled to a source device and a destination device and disposed within a data path (1) between the source device and the destination device, and (2) includes at least one layer-3 device. The layer-2 device receives a first test data unit from the source device, and defines a quality datum associated with processing the first test data unit. The layer-2 device defines a second test data unit based on the first test data unit that includes the quality datum associated with processing the first test data unit. The layer-2 device sends the second test data unit to the layer-3 device. The layer-3 device defines a quality datum associated with processing the second test data unit at the layer-3 device and defines a third test data unit based on the second test data unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.