Process and system for preparation of X-ray scannable sample-embedded sliver for characterization of rock and other samples
US9127529B2 · kind B2 · utility
9Cited by
10References
33Claims
0Family size
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Key dates
| Filing date | Oct 24, 2013 |
| Grant date | Sep 8, 2015 |
| Priority date | — |
| Expiry date | Mar 14, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/616
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is provided to allow characterization of rock or other types of samples using a sliver that is prepared to have a sample and optionally a plurality of thin discrete reference objects encapsulated by hardened encapsulant that surrounds the peripheral edges of the sample and any reference objects. Systems for performing the methods are also provided. An x-ray scannable sliver also is provided as a single unit that has a thin discrete sample and a plurality of thin discrete reference objects encapsulated by hardened encapsulant that encases the peripheral edges of the sample and reference objects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.