Sensor system and method for determining an optical property of a plant
US9128049B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 12, 2013 |
| Grant date | Sep 8, 2015 |
| Priority date | — |
| Expiry date | Jun 18, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8466
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sensor system for determining an optical property of a plant by means of a reflection measurement, having a first light source, which emits light along a first beam axis, and a second light source, which emits light along a second beam axis, and at least one receiver, which is aligned along a third beam axis, to detect light reflected from the plant. The first light source, the second light source, and the receiver are arranged relative to one another so that a target cylinder, which respectively extends along the first beam axis and the second beam axis, and a first measuring cylinder, which extends along the third beam axis, at least partially overlap one another in a measuring space, and the first beam axis and the second beam axis respectively enclose an angle (α, δ) with the third beam axis. Related methods are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.