Non-contact stress measuring device
US9128063B2 · kind B2 · utility
16Cited by
14References
8Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 24, 2010 |
| Grant date | Sep 8, 2015 |
| Priority date | — |
| Expiry date | May 14, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0075
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatuses and methods for measuring stress or strain in a conductive material without physical contact with the material are provided. The device comprises an inductor circuit configured to induce an alternating current into the material along a first path; and a detector configured to detect a signal representative of the stress in the material along the first path when current is induced in the material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.