Micro-granular delay testing of configurable ICs
US9128153B2 · kind B2 · utility
2Cited by
2References
19Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 2, 2014 |
| Grant date | Sep 8, 2015 |
| Priority date | — |
| Expiry date | Sep 2, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K19/17764
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for testing a set of circuitry in an integrated circuit (IC) is described. The IC includes multiple configurable circuits for configurably performing multiple operations. The method configures the IC to operate in a user mode with a set of test paths that satisfies a set of evaluation criteria. Each test path includes a controllable storage element for controllably storing a signal that the storage element receives. The method operates the IC in user mode. The method reads the values stored in the storage elements to determine whether the set of circuitry is operating within specified performance limits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.