Method to characterize shales at high spatial resolution
US9128210B2 · kind B2 · utility
33Cited by
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25Claims
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Key dates
| Filing date | Aug 19, 2013 |
| Grant date | Sep 8, 2015 |
| Priority date | — |
| Expiry date | Sep 3, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and methods of characterizing a subterranean formation sample including collecting a sample from a formation, and analyzing the formation to obtain an image with 100 nm or less resolution, wherein the analyzing comprises atomic force microscopy (AFM), infrared spectroscopy (IR), and thermal analysis. Kerogen maturity, mineralogy, kerogen content, mechanical properties, and transition temperatures—including registered maps of those quantities—may be obtained in 5 minutes or less. Some embodiments may use a scanning electron microscope.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.