Exemplar-based feature weighting
US9129152B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 14, 2013 |
| Grant date | Sep 8, 2015 |
| Priority date | — |
| Expiry date | Dec 27, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/48
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In an example embodiment, for each of the image exemplars, a first location offset between an actual landmark location for a first landmark in the image exemplar and a predicted landmark location for the first landmark in the image exemplar is determined. Then, a probability that the image recognition process applied using the first feature produces an accurate identification of the first landmark in the image exemplars is determined based on the first location offsets for each of the image exemplars. A weight may then be assigned to the first feature based on the derived probability. An image recognition process may then be performed on an image, the image recognition process utilizing a voting process, for each of one or more features, for one or more landmarks in the plurality of image exemplars, the voting process for the first feature weighted according to the weight assigned to the first feature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.