Patent · US Active

Polishing method of non-oxide single-crystal substrate

US9129901B2 · kind B2 · utility

2Cited by
3References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 28, 2013
Grant dateSep 8, 2015
Priority date
Expiry dateOct 28, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/8325
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

There is provided a polishing method for polishing a non-oxide single-crystal substrate such as a silicon carbide single-crystal substrate at a high polishing rate to obtain a high-quality surface that is smooth and excellent in surface properties. This polishing method is a method of supplying a polishing liquid to a polishing pad not including abrasive grains to bring a surface to be polished of the non-oxide single-crystal substrate and the polishing pad into contact with each other and polishing the surface to be polished by a relative movement between them, the method characterized in that the polishing liquid comprises: an oxidant whose redox potential is 0.5 V or more and which contains a transition metal; and water, and does not contain abrasive grains.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.