Method and apparatus for triangulation-based 3D optical profilometry
US9131219B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2012 |
| Grant date | Sep 8, 2015 |
| Priority date | — |
| Expiry date | Apr 21, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N13/20
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for determining a centerline for a triangulation-based optical profilometry system, compensating for the spatial variations of the reflectance of an object's surface. The method comprises providing a luminous line on the object, the luminous line being a triangulation line superposed with a compensation line; capturing an image of the triangulation line and of the compensation line; for each position along the imaged triangulation line, determining a transverse triangulation profile from the imaged triangulation line and a transverse compensation profile from the imaged compensation line; determining a transverse correction profile given by the reciprocal of the transverse compensation profile; multiplying the transverse triangulation profile with the transverse correction profile to obtain a corrected transverse triangulation profile; computing a center of the corrected transverse triangulation profile. The centers determined at positions along the triangulation line form the centerline. Embodiments of a triangulation-based optical profilometry system integrating the method are disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.