Determining tilt angle and tilt direction using image processing
US9134127B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 4, 2014 |
| Grant date | Sep 15, 2015 |
| Priority date | — |
| Expiry date | Feb 4, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30244
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of determining a tilt angle and a tilt direction of a survey instrument. The survey instrument has an imaging device that captures first images at a first location. The first images include features from an environment around the survey instrument. The imaging device also captures second images at a second location. The second images include a portion of the features. A pose of the imaging device is determined at the second location using observed changes in location of a common portion of the features between the first images and the second images. The tilt angle and the tilt direction of the survey instrument at the second location are determined using the pose of the imaging device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.