Patent · US Active

Laser inspection system

US9134232B1 · kind B1 · utility

4Cited by
32References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 15, 2013
Grant dateSep 15, 2015
Priority date
Expiry dateJan 31, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/952
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A non-contact optical probe for inspecting an inside surface of a cylindrical workpiece includes a laser source that emits an incident light beam, a polarizing beam splitter that transmits one polarization of the incident beam and reflects the opposite polarization, a quarter wave plate that together with the polarizing beam splitter separates back reflected return light from the incident laser beam, a probe tip that directs the incident laser beam onto the cylinder surface and directs reflected light from the surface back to the beam splitter, and at least one detector that receives a portion of the reflected light and generates data about the cylinder surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.