X-ray source grating stepping imaging system and image method

US9134259B2 · kind B2 · utility

Assignees

• TSINGHUA UNIVERSITY · CN
• NUCTECH COMPANY LIMITED · CN

Inventors

• Zhifeng Huang · Pleasanton, US
• Zhiqiang Chen · Beijing, CN
• Li Zhang · Beijing, CN
• Yuanjing Li · Beijing, CN
• Yuxiang Xing · Beijing, CN
• Ziran Zhao · Beijing, CN
• Yongshun Xiao · Beijing, CN
• Liang Li · Beijing, CN
• Fei Ding · Thalwil, CH

Key dates

• Filing date: Dec 27, 2010
• Grant date: Sep 15, 2015
• Expiry date: Dec 24, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/419
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An X-ray imaging system comprising: an X-ray source, a source grating, a fixed grating module and an X-ray detector, which are successively positioned in the propagation direction of X-ray; an object to be detected is positioned between the source grating and the fixed gating module; said source grating can perform stepping movement in a direction perpendicular to the optical path and grating stripes; wherein the system further comprises a computer workstation for controlling said X-ray source, source grating and X-ray detector so as to perform the following processes: the source grating performs stepping movement in at least one period thereof; at each stepping step, the X-ray source emits X-ray to the object to be detected, and the detector receives the X-ray at the same time; wherein after at least one period of stepping and data acquisition, the light intensity of X-ray at each pixel point on the detector is represented as a light intensity curve; the light intensity curve at each pixel point on the detector is compared with a light intensity curve in the absence of the object to be detected, a pixel value of each pixel point is calculated from change in said light intensity cu…