Layout information calibrating method and apparatus
US9134934B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 2, 2013 |
| Grant date | Sep 15, 2015 |
| Priority date | — |
| Expiry date | Dec 2, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/1282
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides a layout information calibrating method and device, wherein the calibrating method comprises: obtaining the parameter calibrating standard of layout information and layout information to be calibrated; matching the layout information to be calibrated with the parameter calibrating standard of the layout information; if the layout information to be calibrated is consistent with the parameter calibrating standard of the layout information, sending the information indicating the layout information is successfully calibrated; if the layout information to be calibrated is inconsistent with the parameter calibrating standard of the layout information, sending a reminder indicating the layout information is not successfully calibrated. Adopting the layout information calibrating method and device submitted in the present invention, it is possible to not only effectively avoid calibrating mistakes in the layout production process, but also reduce layout production accidents, accelerate the whole production schedule of the newspaper.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.