System and method for cloud testing and remote monitoring of integrated circuit devices
US9140745B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 5, 2014 |
| Grant date | Sep 22, 2015 |
| Priority date | — |
| Expiry date | May 2, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/273
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a system and method for cloud testing and remote monitoring of IC devices on a computerized test platform, the computerized test platform sends to a cloud server unit, which stores test programs corresponding respectively to different test items, a test request, which includes respective device codes of the IC devices and one (s) of the test items, via a communication network. The cloud server unit sends to the computerized test platform a test response, which includes one (s) of the test programs corresponding to the one (s) of the test items. The computerized test platform products test data corresponding to the device codes of the IC devices in response to execution of the one (s) of the test programs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.