Patent · US Active

Testing apparatus with backdriving protection function

US9140755B2 · kind B2 · utility

1Cited by

12References

7Claims

0Family size

Assignee

Test Research, Inc. · TW

Inventors

Po-Shen Kuo · New Taipei, TW
Hsin-Hao Chen · Taipei, TW

Key dates

Filing date	May 17, 2013
Grant date	Sep 22, 2015
Priority date	—
Expiry date	Oct 31, 2033

Classification

Technology area (CPC H)Electricity
CPC primaryH02H3/087
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

A testing apparatus with a back-drive protection function is disclosed, where the testing apparatus includes a driver and a field programmable gate array (FPGA), where the driver is electrically connected to the FPGA. The FPGA can monitor output current from the driver and perform the back-drive protection function on the driver to protect device-under-test (DUT).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.