Testing a circuit assembly that contains a piezoelectric switch
US9140757B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 27, 2013 |
| Grant date | Sep 22, 2015 |
| Priority date | — |
| Expiry date | Apr 10, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01H36/0006
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method of testing a circuit assembly that includes a piezoelectric switch may include driving a DC current into the piezoelectric switch. The method may further include measuring the time interval it takes to develop a predetermined voltage across the piezoelectric switch and comparing the measured time interval with a first predetermined time interval and a second predetermined time interval. The method may include identifying the circuit assembly as defective when the measured time interval is either less than the first predetermined time interval or more than the second predetermined time interval, and otherwise identifying the circuit assembly is operational.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.