Two-dimensional identification pattern, article including such a pattern, and methods for marking and identifying such a pattern
US9141899B2 · kind B2 · utility
1Cited by
3References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 24, 2010 |
| Grant date | Sep 22, 2015 |
| Priority date | — |
| Expiry date | Sep 24, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K19/06046
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for marking an article with an identification pattern which may include information relating to the article and/or to the use thereof, the method including: defining an alphabet of a plurality of symbols; defining, for each symbol, at least two valid states and at least one invalid state; developing a reference pattern including a set of symbols from the alphabet; developing at least one representation of the reference pattern by allocating a specific valid state to each symbol of the reference pattern; and applying a marking, reproducing the representation of the reference pattern, onto the article.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.