Patent · US Active

Method and apparatus for deriving diagnostic data about a technical system

US9141915B2 · kind B2 · utility

5Cited by

0References

16Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

José Alonso · Libertad, UY
Dieter Bogdoll · Munich, DE
Siegmund Düll · Hersbruck, DE
Glenn E. Sancewich · Cocoa, US
Volkmar Sterzing · Neubiberg, DE

Key dates

Filing date	Jan 30, 2013
Grant date	Sep 22, 2015
Priority date	—
Expiry date	Dec 28, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG06N20/00
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method and apparatus for deriving diagnostic data about a technical system utilizing learning metrics gained by at least one data driven learning process while generating and updating soft sensor models of said technical system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.