Patent · US Active

Calibration of inter-slice gain and offset errors in time-interleaved analog-to- digital converter

US9143147B1 · kind B1 · utility

17Cited by
4References
24Claims
0Family size

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Inventors

Key dates

Filing dateJul 3, 2014
Grant dateSep 22, 2015
Priority date
Expiry dateJul 3, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03M1/1215
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

An analog input signal is dithered using a dithering sequence and then partially chopped using a chopping sequence. The dithered and partially chopped signal is then digitized by analog-to-digital converter (ADC) slices operating in alternating fashion, and the resulting digitized signals are adjusted according to the dithering sequence and the chopping sequence to compensate for gain and voltage offset errors of the ADC slices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.