Measurement of industrial products manufactured by extrusion techniques
US9146092B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 26, 2013 |
| Grant date | Sep 29, 2015 |
| Priority date | — |
| Expiry date | Dec 26, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/8806
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to an apparatus for monitoring extruded products moving in an inline extrusion process so as to affect quality control of the process by continuously measuring dimensional parameters and determining the existence of contaminants in the extrusion. The apparatus makes use of Terahertz radiation, which is adapted to provide a curtain of parallel rays of the radiation, which is scanned across the product as the product passes there-through in a linear manner. The composition of the omitted radiation received after the scanning process is subject to an imaging analysis to determine the dimensional parameters and contaminant free integrity of the extrusion process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.