Patent · US Active

Sampling based runtime optimizer for efficient debugging of applications

US9146831B2 · kind B2 · utility

0Cited by
4References
17Claims
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Key dates

Filing dateNov 27, 2013
Grant dateSep 29, 2015
Priority date
Expiry dateNov 27, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2201/865
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of reproducing runtime environment for debugging an application is disclosed. The method includes accessing an optimizer file from a non-volatile storage medium. The optimizer file includes a runtime environment, application definition information, and a log. The log includes summaries of a plurality of events, the plurality of actions, and a time mark of occurrence for each of the plurality of actions. A runtime environment for debugging the application is then defined and the application runtime is set up using the application definition information in the optimizer file. Further, the method includes running the application and attaching an optimizer, then triggering each of the plurality of actions to occur at each time mark of occurrence associated with the each of the plurality of actions, and analyzing each of the plurality of actions and the plurality of events associated with the each of the plurality of actions, the analyzing includes comparing the events produced by running the application with the plurality of events in the optimizer file. If a fault is produced by the triggering, a debugger is invoked to analyze the fault.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.