Statistical point pattern matching technique
US9147287B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 15, 2013 |
| Grant date | Sep 29, 2015 |
| Priority date | — |
| Expiry date | May 15, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/476
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A statistical point pattern matching technique is used to match corresponding points selected from two or more views of a roof of a building. The technique statistically selecting points from each of orthogonal and oblique aerial views of a roof. generating radial point patterns for each aerial view, calculating the origin of each point pattern, representing the shape of the point pattern as a radial function, and Fourier-transforming the radial function to produce a feature space plot. A feature profile correlation function can then be computed to relate the point match sets. From the correlation results, a vote occupancy table can be generated to help evaluate the variance of the point match sets, indicating, with high probability, which sets of points are most likely to match one another.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.