Combinatorial test device
US9151693B1 · kind B1 · utility
12Cited by
0References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 20, 2012 |
| Grant date | Oct 6, 2015 |
| Priority date | — |
| Expiry date | Jul 6, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04M1/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A combinatorial test device is configurable to contemporaneously test one or more sensors of output devices free from user intervention. A device under test such as a user device is placed in a test fixture of the combinatorial test device. Under the control and monitoring of a test controller testing takes place. The testing may be performed for quality assurance after assembly or repair, or to determine the reliability of the device such as by testing the device until a particular life cycle value is reached or a component in the device fails.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.