Patent · US Active

Method and system for calculating parity values for multi-dimensional RAID

US9152499B1 · kind B1 · utility

10Cited by
18References
20Claims
0Family size

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Key dates

Filing dateOct 9, 2014
Grant dateOct 6, 2015
Priority date
Expiry dateOct 9, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2211/1057
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for calculating parity values including calculating a first set of parity values using datum stored in RAID Grid locations in a first PCB, where datum associated with the RAID Grid locations in the first PCB is obtained in a first order that is based on a Hilbert curve. The method further includes calculating a second set of parity values using datum stored in RAID Grid locations in a second PCB, where datum associated with the RAID Grid locations in the second PCB is obtained in a second order that is based on the Hilbert curve. The method further includes storing at least a portion of the first set of parity values and a second set of parity values in a cache, memory, or persistent storage, where each of the first parity values and second parity values is associated with a separate RAID Grid location in the RAID Grid.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.