Block patterns as two-dimensional ruler
US9153029B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 13, 2011 |
| Grant date | Oct 6, 2015 |
| Priority date | — |
| Expiry date | Apr 8, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A two-dimensional pattern comprises a plurality of R-planes each comprising a tiling of a corresponding R-ary block, being a block of radix R integer values, where for each dimension of the pattern, the least common multiple of the sizes of the tiled blocks in that dimension is greater than the size of the tiling that dimension, and any sub-block of a size less than the tiled blocks occurs on a regular grid with the same periodicity as the tiled block for that R-plane. The pattern may be used in determining a position of a location captured in an image by projecting the pattern onto a scene. An image is captured. The method determines from the captured image a sub-block associated with the location and constructs, a unique integer value for each R-plane. The unique integer values from each R-plane are used to determine the location in the image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.