Methods and apparatus for testing electronic devices with antenna arrays
US9154972B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 12, 2013 |
| Grant date | Oct 6, 2015 |
| Priority date | — |
| Expiry date | Apr 5, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04W24/06
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A wireless electronic device may be provided with antenna structures. The antenna structures may be formed from an antenna ground and an array of antenna resonating elements formed along its periphery. The antenna resonating elements may be formed from metal traces on a dielectric support structure that surrounds the antenna ground. The electronic device may be tested using a test system for detecting the presence of manufacturing/assembly defects. The test system may include an RF tester and a test fixture. The device under test (DUT) may be attached to the test fixture during testing. Multiple test probes arranged along the periphery of the DUT may be used to transmit and receive RF test signals for gathering scattering parameter measurements on the device under test. The scattering parameter measurements may then be compared to predetermined threshold values to determine whether the DUT contains any defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.