Overlapping measurement sequences for interference-resistant compensation in light emitting diode devices
US9155155B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 9, 2014 |
| Grant date | Oct 6, 2015 |
| Priority date | — |
| Expiry date | Oct 9, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05B45/22
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method and illumination device are provided for interference-resistant compensation in light emitting diode (LED) devices. In one embodiment, the method includes initiating a sequence of measurements during multiple measurement intervals interspersed with periods of illumination. The sequence of measurements includes sensitive measurements performed during measurement intervals when a non-constant external illumination is not present, and at least one non-sensitive measurement performed during an interval when non-constant external illumination is present. An embodiment of an illumination device comprising a lamp includes multiple emission LED elements, one or more photodetectors, a storage medium adapted for storing configuration information, and a lamp control circuit. The configuration information includes ordering of sensitive and non-sensitive measurements within a sequence of compensation measurements that the lamp is configured to perform, and ordering of interfering and non-interfering measurements within an additional sequence of measurements that an additional lamp is configured to perform.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.