Apparatus and method for testing a scan chain including modifying a first clock signal to simulate high-frequency operation associated with a second clock signal
US9157962B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 7, 2014 |
| Grant date | Oct 13, 2015 |
| Priority date | — |
| Expiry date | Jan 7, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A circuit including a clock module, a control module, a manipulation module, and a function module. The clock module generates a first clock signal. The control module generates a control signal. The manipulation module, based on the control signal, either (i) forwards the first clock signal without modifying the first clock signal or (ii) modifies a cycle of the first clock signal to simulate a second clock signal. The second clock signal has a frequency higher than a frequency of the first clock signal. The function module: during a first mode and based on a non-modified cycle of the first clock signal, operates devices in a predetermined configuration; ceases operating in the first mode and changes the predetermined configuration of the devices to form a scan chain; and during a second mode and based on the modified cycle, operates the scan chain to test the devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.