In situ system for direct measurement of alpha radiation, and related method for quantifying the activity of alpha-emitting radionuclides in solution
US9158011B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 7, 2011 |
| Grant date | Oct 13, 2015 |
| Priority date | — |
| Expiry date | Jun 15, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/626
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A system for in situ nuclear measurement of alpha radiation of an effluent and a related method. The system includes: M diamond semiconductor detectors obtained by chemical vapor deposition, or silicon semiconductor detectors covered with a diamond layer, as alpha radiation detectors, configured to be immersed in the effluent, and to measure alpha radiation emitted by the effluent, M is an integer greater than or equal to 1; P measuring channels connected to the M alpha radiation detectors, P is an integer greater than or equal to 1 and less than or equal to M, each of the P measuring channels configured to provide a value or a sum of alpha activity values from the M alpha radiation detectors to which they are connected; and, if P is greater than 1, a mechanism for adding together results from the P measuring channels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.