Performance monitor with memory ring oscillator
US9159378B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 6, 2011 |
| Grant date | Oct 13, 2015 |
| Priority date | — |
| Expiry date | Oct 10, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2884
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a monitoring system that includes at least one performance monitor integrated into a semiconductor die. The performance monitor comprises at least one ring oscillator that includes a plurality of stages. Each stage comprises at least one memory device. In one embodiment, the performance monitor may also include a setting circuit that has a burn-in input and an enable input. The setting circuit is capable of setting an input signal of the at least one ring oscillator to a reference voltage level. The performance monitor is configured to produce a ring delay that is characterized by a performance of the at least one memory device. The ring delay may be utilized to scale an operating voltage of the at least one memory device on the semiconductor die.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.