Patent · US Active

Testing system and testing method thereof

US9159451B2 · kind B2 · utility

1Cited by

4References

11Claims

0Family size

Assignee

Silicon Motion, Inc. · TW

Inventor

Chien-Chi Chen · Hsinchu, TW

Key dates

Filing date	Jun 27, 2012
Grant date	Oct 13, 2015
Priority date	—
Expiry date	Nov 22, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/5602
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A testing system for a wafer having a plurality of flash memory dies is provided. The testing system includes a testing apparatus and a probe card coupled to the testing apparatus via a specific transmission line. The testing apparatus provides a testing requirement. The probe card includes a plurality of probes and a controller. The probes contact with at least one of the flash memory dies of the wafer. The controller writes a testing data to the flash memory die according to the testing requirement and reads the testing data from the flash memory die via the probes. The controller provides a testing result to the testing apparatus according to the read testing data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.