Three-dimensional profilometer
US9163936B1 · kind B1 · utility
12Cited by
8References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 7, 2013 |
| Grant date | Oct 20, 2015 |
| Priority date | — |
| Expiry date | May 7, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/25
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Profilometers for industrial metrology and other applications are described. A line is projected on a surface to be profiled. The line is scanned to build a three dimensional point cloud allowing the three-dimensional (3D) profile of the surface to be determined. In some embodiments, the line is projected by a laser system. In other embodiments, the line is projected by a digital micromirror device (DMD). In still further embodiments, multiple lines, or other patterns are projected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.