Phase imaging
US9164045B2 · kind B2 · utility
2Cited by
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15Claims
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Key dates
| Filing date | Jul 19, 2012 |
| Grant date | Oct 20, 2015 |
| Priority date | — |
| Expiry date | Dec 15, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/419
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of phase imaging uses X-ray beams having edges overlapping with pixels. A phase image may be obtained from first and second images using one or more X-ray beam, the first image being measured with the first edge but not the second edge of each X-ray beam overlapping the corresponding pixel(s) and the second image being measured with the second edge but not the first edge overlapping the corresponding pixel(s). The gradient of the X-ray absorption function may be calculated and a proportional term included in the image processing to calculate a quantitative phase image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.