Systems and methods for sample analysis
US9165752B2 · kind B2 · utility
37Cited by
19References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 11, 2014 |
| Grant date | Oct 20, 2015 |
| Priority date | — |
| Expiry date | Dec 11, 2034 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/25875
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.