Ionization with femtosecond lasers at elevated pressure
US9165753B2 · kind B2 · utility
2Cited by
1References
20Claims
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Key dates
| Filing date | Dec 4, 2012 |
| Grant date | Oct 20, 2015 |
| Priority date | — |
| Expiry date | Dec 4, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/26
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present disclosure generally provides ionization methods and devices for use in mass spectrometry. In some embodiments, the ionization methods and devices employ short laser pulses (e.g., pulses having pulsewidths in a range of about 2 fs to about 1 ps) at a high intensity (e.g., an intensity in a range of about 1 TW/cm2 to about 1000 TW/cm2) to ionize an analyte an ambient pressure greater than about 10−5 Torr (e.g., an ambient pressure in a range of about 1 atmosphere to about 100 atmospheres).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.