On-board non-uniformity correction calibration methods for microbolometer focal plane arrays
US9167179B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 11, 2012 |
| Grant date | Oct 20, 2015 |
| Priority date | — |
| Expiry date | Mar 21, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/12753
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
On-board non-uniformity correction calibration methods for a microbolometer focal plane array in a thermal camera are disclosed. The methods include performing first calculations in the processor unit of the thermal camera to generate and apply a set of coarse correction bias voltages to the detector elements. The method also includes performing calculations in the external computer based on image data collected by the thermal camera with the coarse correction bias voltages applied to the detector elements to generate a set of fine correction bias voltages. The method also includes downloading the fine correction bias voltages to the thermal camera and applying the fine correction voltages to the detector elements to establish a fine calibration of the microbolometer focal plane array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.