System and method for analyzing an electronics device including a logic analyzer
US9170901B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 30, 2011 |
| Grant date | Oct 27, 2015 |
| Priority date | — |
| Expiry date | Jul 19, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/273
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system for testing or debugging a device under test having an embedded logic analyzer. In one embodiment, the system includes software stored in non-transitory memory for testing a device under test having an embedded logic analyzer, the software program product having instructions which, when executed by a computing device associated with the device under test cause the computing device to reconstruct signals of interest in the device under test based at least in part upon signals captured by the embedded logic analyzer during the test or debug session, and cause the computing device to display the reconstructed signals of interest to a user of the computing device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.