Systems and methods for simultaneously measuring forward and reverse scattering parameters
US9176174B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2014 |
| Grant date | Nov 3, 2015 |
| Priority date | — |
| Expiry date | Jun 3, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system adapted to measure electrical performance of a device under test (DUT) having two or more ports includes a plurality of signal sources synchronized and configured to generated signals simultaneously, a plurality of first signal paths to obtain transmitted and reflected signals from the DUT, a plurality of second signal paths to obtain incident signals from the signal sources, and a receiver for receiving the reflected, transmitted and incident signals obtained at the first signal paths and the second signal paths. The receiver is adapted to separate the reflected and the transmitted signals obtained from each of the first signal paths. The signal sources are configured to each generate a signal having a frequency offset from each of the others of the signal sources by a known frequency delta.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.