Patent · US Active

Magnetic layer patterning by ion implantation

US9181618B2 · kind B2 · utility

0Cited by
6References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 2, 2015
Grant dateNov 10, 2015
Priority date
Expiry dateMar 2, 2035

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/24612
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

Provided herein is a method including conformally depositing a first layer over a patterned resist; depositing a second, thicker layer over the first layer; etching the second layer to expose the first layer; and patterning a magnetic layer by ion implantation in accordance with the patterned resist to form a patterned magnet layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.