Patent · US Active

Path measuring apparatus with multiple measuring paths

US9182213B2 · kind B2 · utility

3Cited by

7References

49Claims

0Family size

Assignee

BALLUFF GMBH · DE

Inventors

Achim Zern · Heilbronn, DE
Gerd Eckel · Wissen, DE

Key dates

Filing date	Jan 31, 2013
Grant date	Nov 10, 2015
Priority date	—
Expiry date	Dec 9, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01D11/245
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a path measuring apparatus comprising at least a first measuring path and a second measuring path, these measuring paths each having an extension in a longitudinal direction and being oriented parallel to one another in at least a measuring range, at least one position indicator which couples to the measuring paths in a non-contact manner, and a measuring path holder which extends in the measuring range and has recesses, each recess having a measuring path arranged therein.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.