Methods of measuring a characteristic of a creping adhesive film and methods of modifying the creping adhesive film
US9182271B2 · kind B2 · utility
1Cited by
14References
20Claims
0Family size
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Key dates
| Filing date | Dec 18, 2014 |
| Grant date | Nov 10, 2015 |
| Priority date | — |
| Expiry date | Dec 18, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/0426
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Described herein are quartz crystal microbalance (QCM) and quartz crystal microbalance with dissipation (QCMD) techniques that can be used for measuring characteristics of a creping adhesive film similar to the creping adhesive film that is formed on a Yankee dryer during the tissue and towel manufacturing process. In addition, exemplary embodiments described herein may use these techniques to predict performance of creping aids utilized to form a creping adhesive film.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.