Method of storing data in nonvolatile memory device and method of testing nonvolatile memory device
US9183946B2 · kind B2 · utility
0Cited by
4References
18Claims
0Family size
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Key dates
| Filing date | Jan 13, 2014 |
| Grant date | Nov 10, 2015 |
| Priority date | — |
| Expiry date | Jan 18, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/50016
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of storing data in a nonvolatile memory device comprises performing a program operation on target memory cells among multiple memory cells, performing a first verify operation to determine whether the target memory cells are in a program pass state or a program fail state, and as a consequence of determining that the target memory cells are in the program pass state, performing a second verify operation to determine whether the target memory cells exhibit a program error symptom.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.