Patent · US Active

Method for producing an optoelectronic nitride compound semiconductor component

US9184051B2 · kind B2 · utility

2Cited by
5References
15Claims
0Family size

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Inventors

Key dates

Filing dateSep 21, 2012
Grant dateNov 10, 2015
Priority date
Expiry dateSep 21, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of producing a nitride compound semiconductor component includes providing a growth substrate having a silicon surface, growing a buffer layer containing an aluminum-containing nitride compound semiconductor onto the silicon surface, growing a stress layer structure that produces a compressive stress, and growing a functional semiconductor layer sequence onto the stress layer structure, wherein the stress layer structure includes a first GaN semiconductor layer and a second GaN semiconductor layer, a masking layer is embedded in the first GaN semiconductor layer, an Al(Ga)N-intermediate layer that produces a compressive stress is disposed between the first GaN semiconductor layer and the second GaN semiconductor layer, and the stress layer structure does not contain further Al(Ga)N-intermediate layers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.